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Research suggests multi-contrast X-ray imaging could find hidden threats at airports

The new security scanning technique combines attenuation and dark-field x-ray imaging to create multi-contrast images, and detects threatening materials using machine learning

The new security scanning technique combines attenuation and dark-field x-ray imaging to create multi-contrast images, and detects threatening materials using machine learning. Image: Thomas Partridge, UCL

Research conducted at UCL shows that multi-contrast images, generated by combining different x-ray imaging technologies like attenuation and dark field with machine learning, can improve the detection of threatening materials.

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