Princeton Infrared Technologies, Inc. (PIRT), specialists in indium gallium arsenide (InGaAs) imaging technology and affordable shortwave-infrared (SWIR) linescan cameras, visible-SWIR science cameras, and 1- and 2-D imaging arrays, introduces the 1280BPCam, an extended-SWIR response camera developed specifically for laser beam profiling. The new InGaAs/GaAsSb (InGaAs/gallium arsenide antimonide) type-II super lattice (T2SL) detector features 1280 x 1024 pixels on a small 12-µm array pitch that delivers 90 frames per second (fps) at full resolution.
The extended wavelength response of the T2SL material plus the 3-stage thermoelectric cooler (TEC) enable high sensitivity from 400 nm to 2050 nm, making it possible to image from the Visible out to the SWIR spectrum with a single imager. The high-resolution imagers are specially fabricated on 100 mm substrates to enable low-cost production.
The 1280BPCam’s advanced focal plane array integrated in the camera generates full 14-bit pixel data at high resolution which is reliably transferred by a Medium Camera Link interface. Other notable features include snapshot exposure, selectable trigger modes, and user-selectable regions of interest (ROI). Integration times range from 50 µs to greater than 16 ms. With less than 275e- read noise, high dynamic range of greater than 1000:1, plus greater than 20% quantum efficiency for 1.9 µm, the extended SWIR beam profiling detector camera is ideal for use in a variety of industrial, medical, and defense applications.
To see a live demo of Princeton Infrared Technologies’ advanced 1280BPCam for laser beam profiling, please visit booth #8371 at SPIE’s BiOS, January 22 - 23, 2022, and booth #3371 at Photonics West, January 25 - 27, 2022, Moscone Center, San Francisco.
