Eye Vision Technology (EVT) has released its Glass Wafer Inspection (GWI) system, designed to detect defects in glass wafers early in the production cycle. The system is based on a smart camera with 5 megapixel resolution for accurate defect detection in glass, although higher resolutions are available.
The complete system is comprised of a black aluminium frame holding the smart camera. A high power LED light illuminates the wafer from the underneath. Depending on the size of the glass wafer, the diameter of the hole above the light can be altered.
The inspection unit has Ethernet, RS232 and Power I/O connections. An optional USB interface is also available. The camera has a 1GHz ARM Cortex A8 CPU and an additional 800MHz DSP for image processing. Processed images are transferred to a PLC. There is also an option to connect a display to the camera to see the results on a screen.
The software is based on EyeVision 2.6R036LTS (Long Term Support), which will be replaced with the next generation EyeVision 3.0 software.
