Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength of their light emissions. This inspection system utilizes a photoluminescence (PL) measurement technique that is based on our advanced image processing technology and a newly developed imaging module with our unique optical design technology. We call this micro-LED PL inspection system the ‘MiNYTM PL’, type number C15740-01.
The MiNYTM PL makes fast pass/fail decisions when inspecting micro-LEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D efficiency of micro-LEDs. Furthermore, the MiNYTM PL will also streamline the 100 percent inspection process of micro-LEDs in future mass production lines. Sales of the MiNYTM PL will start Monday March 8, 2021 to LED and display manufacturers in domestic and overseas markets.
PL measurement technique is a versatile method for evaluating characteristics of LED and other devices by capturing and analyzing light-excited photoluminescence images in a non-contact and non-invasive manner.
