GE's Inspection Technologies business has released the Phoenix Nanotom M for high resolution and high precision X-ray computed tomography (CT) in non-destructive 3D analysis and dimensional metrology. Featuring fully-automated CT scan execution, reconstruction and the analysis process, it offers ease of use as well as fast and reproducible CT results, in applications ranging from small biological and geological samples to medium sized industrial components such as injection nozzles or injection moulded plastic parts, even with metal inlays.
The Nanotom M incorporates a new Phoenix 180kV/15W, high power nanofocus X-ray tube, which is optimised for long-term stability and allows scanning of high absorbing materials such as metals and ceramics. The internal cooling of the tube also significantly reduces thermal effects such as drift, to ensure even sharper imaging as well as allowing the long scanning times frequently required in scientific research.
The CT system also features a high dynamic range, typically five times better than the current Nanotom S, because of its temperature-stabilised, 3,072 x 2,400 pixel DXR 500L detector from GE. With such a large detector area, this allows sample sizes of up to 250 x 240mm and the combination of GE technology in terms of X-ray tube, detector, generator and CT software ensures that a voxel resolution of up to 300nm can be achieved
The system can also be supplied with a comprehensive 3D metrology package. This is optimised for stable and reproducible environmental and acquisition condition and provides fast reconstruction and precise measurement results. It also includes a calibration object and GE's Phoenix Datos|x 2.0 CT software packages Click & Measure|CT and Metrology. With Datos|x 2.0, the entire CT process chain can be fully automated, reducing operator time by a factor of up to five.
