The new Xeva-2.5-320 is on display at BiOS and Photonics West 2017. The Xeva-2.5-320 is a SWIR camera designed for use in R&D applications like laser beam analysis and profiling, semiconductor inspection, hyperspectral imaging etc. where an extended SWIR range up to 2.5 µm is necessary.
The Xeva-2.5-320 SWIR camera is equipped with a Type 2 Super Lattice (T2SL) detector that is sensitive from 1.0 to 2.5 µm. It features a resolution of 320 x 256 pixels with a 30 µm pixel pitch. It outputs 14-bit data and is available in a 100 Hz or 350 Hz version. The Xeva-2.5-320 is equipped with a TE4 cooler. Together with its excellent thermos-mechanical design the operating temperature can be brought down to 203 K, guaranteeing low noise and dark current values, and resulting in excellent image quality. Other features include standard CameraLink or USB 2.0 interfaces, user-friendly Xeneth software, and an optional software development kit.
