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CNR-IMM cuts electron microscopy beam damage and speeds up imaging with compressed sensing
Navigating the vision: To build or buy in the manufacturing revolution
Imagia unveils metasurface processing optics for energy-efficient feature detection
STMicroelectronics launch new dToF and iToF sensors
Wafer-scale, hybridised semiconductors to be created for U.S. DoD
US Chips Act grant to advance computer vision, boost semiconductor workforce
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