The European Machine Vision Association (EMVA) has opened calls for its Young Professional Award, an annual prize honouring machine vision or image processing work by a student or a young professional. The association has also released details of its first presentation forum at the Control trade fair.
Applicants have until 8 April to submit abstracts for the award, with the winner announced at the EMVA business conference, taking place 9-11 June in Edinburgh, Scotland.
The aim of the award is to encourage students and young scientists from European institutions to focus on challenges in the field of machine vision. The award also acts as a bridge between research and industry, asking students to apply their latest research results and findings in computer vision to the practical needs of the machine vision industry.
The criteria for the award include outstanding innovative work in the field of vision technology with industrial relevance. Work has to be made within the last 12 months by a student or young researcher during their education at, or in collaboration with, a European institution. The targeted industry is free of choice, and commercialisation is not required.
Abstracts of two pages in English describing the work can be submitted to the EMVA Secretariat, Natalia Soto at ypa@emva.org.
The EMVA will also run presentations on applied machine vision and optical metrology during Control, the trade fair for quality assurance taking place from 26-29 April in Stuttgart, Germany.
The Control Vision Talks will offer presentations during all four show days, and will demonstrate the advantages of machine vision and optical metrology for quality assurance. Topics include 3D vision, optical metrology, infrared and hyperspectral imaging, and optical inspection.
Further information:
